ABNMtech Electronic component X-ray testing system

Electronic component X-ray testing system

The electronic component testing system is a system that uses X-ray technology to perform non-destructive testing on electronic components. It emits high-energy X-ray beams to irradiate the tested components, and utilizes phenomena such as X-ray transmission, scattering, and absorption to obtain information about the internal structure, defects, or abnormal conditions of the components.

Electronic component testing is a high-tech product that integrates modern computer software technology, precision mechanical manufacturing technology, optical technology, electronic technology, sensor technology, non-destructive testing technology, and image processing technology. It is an effective means of conducting product research, failure analysis, highly reliable screening, quality evaluation, process improvement, and other related work.

Scope of Application

● Suitable for testing BGA, CSP, Flip chip

● PCB board welding condition inspection

● Various battery testing

● IC packaging inspection

● Components such as capacitors and resistors

● Internal defects of metal materials and dielectric materials

● Internal structure and components of lightweight materials

● Electric heating tubes, pearls, precision components, etc

The main functions of the image processing system are:

● Virtual 3D imaging, real-time zooming in and out;

● Grayscale optimization, real-time pseudo color, user-friendly design;

● Electronic filming, multi frame overlay, fast and convenient;

● Supports positive/negative images, with edge enhancement;

● Curvature measurement and statistics;

● Measurement tools;

● BGA solder ball measurement technology;

● Can measure angles, radii, solder joint areas, and bubble areas;

● Calculation of the proportion of bubbles; Coordinate positioning and statistics of solder joints;

● Dynamic storage; Multiple output methods including storage, printing, DVD reading and writing.

Specification

● Micro focus X-ray source

● Voltage regulation range: 20-160kV

● Tube current regulation range: 0.1 μ A~1000 μ A

● Focus size: 1 μ m, 5 μ m, 30 μ m

● JIMA resolution: 0.5 μ m~2 μ m

● Magnification factor: 20x~3000x

● The detection platform can move along multiple axes X-Y-Z